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IEEE International Test Conference (TC) Impact factor 2025


The latest impact factor of IEEE International Test Conference (TC) and all the other Web of Science journals was released on 20th June 2025 by Clarivate. Through this web page, researchers can check the impact factor, total citation, journal quartile, and journal aim & scope.

IEEE International Test Conference (TC): Aim & Scope

IEEE International Test Conference (TC) is a Web of Science indexed journal tha publishes research in the area: Applied Mathematics; Electrical and Electronic Engineering.
The ISSN of this journal is 10893539.

Impact factor of IEEE International Test Conference (TC)

Journal Title IEEE International Test Conference (TC)
Impact Factor
SJR 0.48
ISSN 10893539
Quartile -

The Journal Impact Factor is defined as citations to the journal in the JCR year to items published in the previous two years, divided by the total number of scholarly items, also known as citable items, (these comprise articles and reviews) published in the journal in the previous two years.

Impact factor data has a strong influence on the scientific community, affecting decisions on where to publish, whom to promote or hire, the success of grant applications, and even salary bonuses.

Only journals listed in the Science Citation Index Expanded (SCIE) and Social Sciences Citation Index (SSCI) receive an Impact Factor.


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About SCI

SCI is a multidisciplinary citation index. Science Citation Index covers 9,000+ journals across 177 scientific disciplines. SCI was established in 1900 to the current. SCI-indexed journals are indexed by SCI and SSCI. SCI is described as the world's leading journal.

All journals covered in this database are reviewed for sufficiently high quality each year.


How to publish in SCI journals?

  1. Identify an SCI indexed Journal.
  2. Compose Your Research Paper As Per The Guidelines Of The Journal.
  3. Visit the journal's website to submit your research paper.
  4. Notification Of Acceptance From The Publisher.
  5. Confirmation Of Your Paper Being Published


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