INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS Impact factor 2025

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The latest impact factor of INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS and all the other Web of Science journals was released on 20th June 2025 by Clarivate. Through this web page, researchers can check the impact factor, total citation, journal quartile, and journal aim & scope.

INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS: Aim & Scope

INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS is a Web of Science indexed journal tha publishes research in the area: Engineering, Electrical & Electronic | Materials Science, Multidisciplinary.
The ISSN of this journal is 2232-6979.

Impact factor of INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS

Journal Title	INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS
Impact Factor	0.6
SJR
ISSN	2232-6979
Quartile

Impact Factor from year 2018-2024

Year	Impact Factor
2018	0.476
2019	0.356
2020	0.34
2021	0.442
2022
2023	1.2
2025	0.6

The Journal Impact Factor is defined as citations to the journal in the JCR year to items published in the previous two years, divided by the total number of scholarly items, also known as citable items, (these comprise articles and reviews) published in the journal in the previous two years.

Impact factor data has a strong influence on the scientific community, affecting decisions on where to publish, whom to promote or hire, the success of grant applications, and even salary bonuses.

Only journals listed in the Science Citation Index Expanded (SCIE) and Social Sciences Citation Index (SSCI) receive an Impact Factor.

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About SCI

SCI is a multidisciplinary citation index. Science Citation Index covers 9,000+ journals across 177 scientific disciplines. SCI was established in 1900 to the current. SCI-indexed journals are indexed by SCI and SSCI. SCI is described as the world's leading journal.

All journals covered in this database are reviewed for sufficiently high quality each year.

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