MICROELECTRONICS RELIABILITY Impact factor 2025

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The latest impact factor of MICROELECTRONICS RELIABILITY and all the other Web of Science journals was released on 20th June 2025 by Clarivate. Through this web page, researchers can check the impact factor, total citation, journal quartile, and journal aim & scope.

MICROELECTRONICS RELIABILITY: Aim & Scope

MICROELECTRONICS RELIABILITY is a Web of Science indexed journal tha publishes research in the area: Engineering, Electrical & Electronic | Nanoscience & Nanotechnology | Physics, Applied.
The ISSN of this journal is 1872-941X.

Impact factor of MICROELECTRONICS RELIABILITY

Journal Title	MICROELECTRONICS RELIABILITY
Impact Factor	1.6
SJR	0.364
ISSN	1872-941X
Quartile	Q2

Impact Factor from year 2018-2024

Year	Impact Factor
2018	1.236
2019	1.483
2020	1.535
2021	1.589
2022
2023	1.6
2025	1.6

The Journal Impact Factor is defined as citations to the journal in the JCR year to items published in the previous two years, divided by the total number of scholarly items, also known as citable items, (these comprise articles and reviews) published in the journal in the previous two years.

Impact factor data has a strong influence on the scientific community, affecting decisions on where to publish, whom to promote or hire, the success of grant applications, and even salary bonuses.

Only journals listed in the Science Citation Index Expanded (SCIE) and Social Sciences Citation Index (SSCI) receive an Impact Factor.

Similiar journals to publish

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MICROELECTRONICS RELIABILITY

ISSN: 1872-941X
Journal Impact: 1.6
Journal Scope: Engineering, Electrical & Electronic | Nanoscience & Nanotechnology | Physics, Applied

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Journal Impact: 1.9
Journal Scope: Engineering, Electrical & Electronic | Nanoscience & Nanotechnology

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Journal Impact: 0.7
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Journal Impact:
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Journal Impact:
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About SCI

SCI is a multidisciplinary citation index. Science Citation Index covers 9,000+ journals across 177 scientific disciplines. SCI was established in 1900 to the current. SCI-indexed journals are indexed by SCI and SSCI. SCI is described as the world's leading journal.

All journals covered in this database are reviewed for sufficiently high quality each year.

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